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Atomic Force Microscope (AFM),

Our AFM imaging technique uses a very high resolution type SPM, more than 1000 times higher quality than the optical diffraction limits and it is used predominatley as a tool for imaging, measuring and manipulating matter at the nanoscale. The atomic force microscope (AFM) or scanning force microscope (SFM) uses a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer.

Contact e.bilotti@qmul.ac.uk +442078827575

Issues with this record should be reported to equpiment-data@qmul.ac.uk