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JEM - 2100F Electron Microscope

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Structural/elemental/electronic atomic scale characterisation of nanoscale cluster/materials Purchased as part of the ERDF funded Creating and Characterisating Next Generation of Advanced Materials Project the JEOL Aberration-Corrected Transmission Electron Microscope (JEM-2100F) High resolution imaging, Materials qualification, Chemical analysis, Particles detection/characterisation, Defects analysis, Microstructural characterisation.

Contact Richard Palmer R.Palmer@bham.ac.uk

Issues with this record should be reported to a.c.jones@bham.ac.uk