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Hiden Analytical EQS 300 SIMS Probe

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Hiden Analytical EQS 300 SIMS Probe & Primary Ion Gun **Secondary Ion Mass Spectrometer bolt on SIMS Analyser. *Static / Dynamic SIMS with energy analysis *Integral front end ioniser for RGA *Composition / contamination analysis *Depth profiling *Leak detection and desorbed gas analysis *Compatible with Hiden SIMS Workstation *Suitable for FIB-SIMS integration** A component of a larger MBE Growth System, it is impractical to loan this item individually. Please liaise with primary contact to discuss and arrange access.

Contact RITCHIE, Professor DA dar11@cam.ac.uk +441223337331

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