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Linseis TFA-Thin Film Analyzer

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Linseis TFA-Thin Film Analyzer for the physical property measurement of thin films (nm to µm range) with temperature dependent measurements (-170 to +200°C and optional 300°C). The basic system is designed to measure electrical resistivity and conductivity, seebeck coefficients and emissivity. This magnetic package also measures hall constant, mobility, and charge carrier concentration (magnet model Semimetrics AE7030). Please liaise with the primary contact to discuss and arrange access.

Contact SIRRINGHAUS, Prof. H +441223337557

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