The new bench-top Optical Profiling System has many performance attributes, including easy measurement set-up, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability. The NT9100 employs coherence scanning interferometry, also known as white-light interferometry, white-light confocal, or vertical scanning interferometry to produce high quality three-dimensional surface maps of the object under test.
The instrument is equipped with Through Transmissive Media (TTM) Module enabling high resolution measurements through dispersive material surface/packaging up to 5mm thick with a 10X objective.
A data stitching option adds a motorised stage and support software to scan larger surface areas, and an optional X-Y stage automation option brings programmability the tabletop profiler.
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