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FEI Philips XL30 ESEM-FEG Environmental Scanning Electron Microscope System

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FEI Philips XL30 ESEM-FEG Environmental Scanning Electron Microscope System. Variable pressure SEM up to 20 torr (21 mbar). Specification: * SE, BSE and GSE detectors, * High pressure "Needle" detector (up 20 mbar), * "Wet" STEM detector, * EDS (EDAX) and CL detector, * Variable imaging gas capacity, * Heating (up to 200°C) and Peltier (-20°C- 50°C) stages, * Cryo stage (Gatan), * Integrated Tenselometer (200N), * High-speed beam blanking device (< 30ns), * Micromanipulator (Kleindiek, Nanotechnik). Please liaise with primary contact to discuss and arrange access.

Contact LANGFORD, Dr Richard rml42@cam.ac.uk +441223765618

Issues with this record should be reported to equipment_sharing@admin.cam.ac.uk