Equipment.Data Logo

Scanning Electron Microscope FEI Inspect-F - primary analytical electron microscope for chemical composition work

High vacuum FEG source scanning electron microscope (SEM); EDS high speed elemental analysis and mapping; WDS high spectral resolution elemental analysis (10eV); EBSD crystallographic texture analysis, grain orientation and mapping; Scanning Transmission Electron Microscopy (STEM) in high-vacuum with sub-nanometre resolution

Contact a.j.bushby@qmul.ac.uk +442078825276

Issues with this record should be reported to equpiment-data@qmul.ac.uk