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X-Ray Fluorescence Analyser XDL-Z Fischer Instruments

Used for non-destructive thickness measurements when the element number is Ti or larger (Z>=22) on both single and multiple layers.Also capable of quantifying up to 4 elements in an alloy/diffused coating. Also used for measuring metal content in solutions, again where Z>=22. Programmable X-Y table allows large numbers of measurements to be taken automatically. Focus/adjustable Z-axis along with a camera allows local analysis of large/complex objects. Smallest spot size is approx 1.5mm2.
Part of Organization: Cranfield Uni


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