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Analytical Scanning Electron Microscope

Conventional W filament, high vacuum, scanning electron microscope, calibrated with full set of element standards for analysis of polished material surfaces. Fitted with secondary and backscattered electron detectors and EDX and WDX spectrometers.
Part of Organization: EARTH AND OCEAN SCIENCES

Contact Mr Peter Fisher fisherpc@cardiff.ac.uk +442920875059

Contact equipment@cardiff.ac.uk

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