The FEI Tecnai™ F20 is a versatile Transmission Electron Microscope (TEM) that can operate in conventional parallel illumination mode or as a Scanning Transmission Electron Microscope (STEM). In STEM mode the system is able to provide high spatial resolution chemical information from either the revolutionary new large area (80mm^2) windowless Silicon Drift Detector (SDD) or the complementary spectrum mapping using the Gatan ENFINA Electron Energy Loss Spectrometer.
The system is one of the second generation (G2) series of microscopes that use a thermally assisted field emission gun. The Supertwin (S-TWIN) symmetric lenses are optimized for versatility combining high resolution in both TEM and STEM, whilst providing sufficient space for high angular sample manipulation and high count rate capability in X-Ray microanalysis. In addition to the EDS and PEELS spectometers, the system is also equipped with a Gatan mulitscan CCD camera, a Fischione High Angular Dark Field detector (HAADF) and separate bright field and dark field detectors.
Model: TECNAI F20