Scanning Electron Microscope
High resolution field emission gun scanning electron microscope (FEGSEM), which provides the ability to visualize surface features of material down to 1 nanometre resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and an electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces. Furthermore, a variable pressure sample chamber enables non-conducting specimens to be observed without coating.
Instrument Features
- Energy dispersive X-ray spectroscopy (EDS) using Oxford Instruments X-Max 80mm2 Detector
- Electron backscattering diffraction detector (EBSD) with HKLNordlys F high speed Camera
- Fore-scatter detectors (FSD)
- Back-scattered detector (QBSD)
- Inlens annular detector
- Variable Pressure Mode
- Oxford Instruments Aztec EDS/EBSD microanalysis software with TrueMap capability.
Model: 1530 VP
Manufacturer: Carl Zeiss (Leo)
Contact 
k.yendall@lboro.ac.uk
Contact s.s.doak@lboro.ac.uk
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