High resolution field emission gun scanning electron microscope (FEGSEM), which provides the ability to visualize surface features of material down to 1 nanometre resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and an electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces. Furthermore, a variable pressure sample chamber enables non-conducting specimens to be observed without coating.
Energy dispersive X-ray spectroscopy (EDS) using Oxford Instruments X-Max 80mm2 Detector
Electron backscattering diffraction detector (EBSD) with HKLNordlys F high speed Camera
Fore-scatter detectors (FSD)
Back-scattered detector (QBSD)
Inlens annular detector
Variable Pressure Mode
Oxford Instruments Aztec EDS/EBSD microanalysis software with TrueMap capability.
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