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Dimension 3100 AFM

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The Dimension 3100 utilises standard and advanced SPM imaging modes for measuring semiconductor wafers, lithography masks, magnetic media, biomaterials, optics and other materials. The sample stage  will allow large sample sizes (up to a 6 inch wafer) with a scan size up to 100 µm in the X & Y and 6 µm in the Z.

Model: 3100 AFM

Manufacturer: Bruker

Contact r.thorogate@ucl.ac.uk

Contact b.hoogenboom@ucl.ac.uk

Issues with this record should be reported to research-equipment@ucl.ac.uk