The FEGSEM is fitted with Oxford Instruments INCA energy dispersive and wavelength dispersive x-ray spectrometers. Excellent beam current stability enables reliable and accurate quantitative x-ray analysis to be performed. The WD spectrometer enables accurate analysis of low Z elements such as B and C and deconvolution of overlapping signals in EDS. The microscope is also fitted with an EBSD detector and associated HKL software for determining grain structure and orientation by scanning a nanosize probe over the surface of the sample. This is a valuable tools for investigators wishing to study crystal orientation and texture.
If your search on our database results in an equipment or facilities collaboration we'd like to hear about it, all feedback on both successes and challenges will help us in enabling more partnerships. Click on the feedback tab.