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High Res Feg-SEM (Leo)

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The FEGSEM is fitted with Oxford Instruments INCA energy dispersive and wavelength dispersive x-ray spectrometers. Excellent beam current stability enables reliable and accurate quantitative x-ray analysis to be performed. The WD spectrometer enables accurate analysis of low Z elements such as B and C and deconvolution of overlapping signals in EDS. The microscope is also fitted with an EBSD detector and associated HKL software for determining grain structure and orientation by scanning a nanosize probe over the surface of the sample. This is a valuable tools for investigators wishing to study crystal orientation and texture.
Part of Organization: Royal School Of Mines

Contact Dr Mahmoud Ardakani

Contact Dr Ecaterina Ware

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