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Focused Ion Beam (FIB) FEI Strata 200xP FIB FEI

Uses a gallium beam to mill, pattern and image samples with 15-20nm resolution. Can also deposit small areas of platinum in controlled conditions. Useful to cut cross sections in samples ready for SEM imaging.
Part of Organization: Cranfield Uni

Contact equipment@cranfield.ac.uk

Issues with this record should be reported to equipment@cranfield.ac.uk