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JSM-7800F Field Emission Scanning Electron Microscope

More information.

Analytical field emission scanning electron microscope (FE-SEM), that enables high resolution observation of the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces and large area EBSD maps at low magnifications without distortion.

Column Modes

  • SEM
  • Large Depth Focus (LDF)
  • Gentle Beam (GB)

System detectors

  • Lower Electron Detector (LED)
  • Upper Electron Detector (UED)
  • Upper Secondary Electron Detector (USD)
  • Retractable Electron Backscatter Detector (RBEI)

Model: JSM - 7800F

Manufacturer: JEOL

Contact k.yendall@lboro.ac.uk

Contact s.s.doak@lboro.ac.uk

Issues with this record should be reported to kit-catalogue@lboro.ac.uk