Analytical field emission scanning electron microscope (FE-SEM), that enables high resolution observation of the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces and large area EBSD maps at low magnifications without distortion.
Model: JSM - 7800F
Manufacturer: JEOL
Contact k.yendall@lboro.ac.uk
Contact s.s.doak@lboro.ac.uk