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Scanning electron microscope - JEOL SEM6480LV

Low vacuum mode, Backscattered electron detector, Oxford INCA X-ray analyser, Magnifications up to 300,000x, Large sample chamber (up to 20cm), Fully automated stage controls.
Part of Organization: Chemistry

Contact Ursula Potter +441225385651

Issues with this record should be reported to research-equipment-sharing@bath.ac.uk