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XPS or ESCA instrument

More information.

Multi-technique X-ray Photoelectron Spectroscopy with XPS-mapping capability. XPS is a spectrocopic technique that probes the binding energy of electrons at the surface of a sample. Within an ultra high vacuum, the sample is irradiated by x-ray, whilst emited electrons are quantified and their energy measured using a hemispherical analyser and delay line detector.

Model: Axis Ultra XPS

Manufacturer: Kratos

Contact pczefs@exmail.nottingham.ac.uk

Contact pczank@exmail.nottingham.ac.uk

Issues with this record should be reported to kitcatalogue@nottingham.ac.uk