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Omniscan MicroXAM 5000B 3d ADE Phase shift interference contrast optical profiler

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3D surface mapping. Measures step heights from less than a nanometer (0.001 micron, or 10 Angstrom) up to millimetres.

Contact Alison Crossley alison.crossley@materials.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk