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Veeco Dimension 3100 Atomic Force Microscope (AFM)

More information.

Substrates up to 150 mm diameter and 12 mm thick Z-range of 6 µm x-y imaging area of 90 µm Thermal AFM temperature measurement capability
Part of Organization: James Watt Building

Contact Professor Douglas Paul Douglas.Paul@ glasgow.ac.uk

Issues with this record should be reported to Linsey.Robertson@glasgow.ac.uk