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Semiconductor Parameter Test with Integrated CV

More information.

The Cascade Microtech Microchamber (up to 150 mm substrate capability) also has an Agilent B1500A Semiconductor Parameter Test system with integrated CV test card and variable duty-cycle pulsed measurement capability down to 10 ns. There are also 3 older HP Semiconductor Parameter Analysers with a range of probe stations for dc characterisation.
Part of Organization: James Watt Building

Contact Professor Douglas Paul Douglas.Paul@ glasgow.ac.uk

Issues with this record should be reported to Linsey.Robertson@glasgow.ac.uk