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Semiconductor Parameter Test with Integrated CV

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The Cascade Microtech Microchamber (up to 150 mm substrate capability) also has an Agilent B1500A Semiconductor Parameter Test system with integrated CV test card and variable duty-cycle pulsed measurement capability down to 10 ns. There are also 3 older HP Semiconductor Parameter Analysers with a range of probe stations for dc characterisation.
Part of Organization: James Watt Building

Contact Professor Douglas Paul Douglas.Paul@

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