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Dimension Atomic Force Microscope (AFM)

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This Atomic Force Microscope is capable of measuring and imaging atomic scale features and forces on sample surfaces. The AFM can operate in two modes, contact and tapping, allowing a range of applications including surface topography, phase imaging, and force interactions. It can take samples up to 200mm in diameter and 12mm in thickness. The Dimension 3000 is situated on an Air-table within a Vibration Isolation Chamber.

Contact a.flint2@brighton.ac.uk

Contact m.helias@brighton.ac.uk

Issues with this record should be reported to J.Wells@brighton.ac.uk