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MTS Nano Indenter XP

To analyse mechanical properties of surfaces or thin films. Load resolution of ~10 nN; displacement resolution of ~0.01 nm. Max indentation load of 500 mN. High load, XP head, DCM head. Nanopositioning stage (for pseudo AFM mapping). ~50nm tip radius Berkovich for general use.

Contact Colin Johnston colin.johnston@materials.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk