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Veeco AutoProbe

More information.

High resolution surface analysis (up 100 microns x 100 microns). Force-distance analysis for local compliance (nanoindentation). Topography imaging using Contact Mode or TappingMode. Lateral resolution > 1 nm; height resolution >1 A. Not suitable for wet samples.

Contact Colin Johnston colin.johnston@materials.ox.ac.uk

Contact Alison Crossley alison.crossley@materials.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk