Equipment.Data Logo

Atomic force microscope

Model: Keysight 5500 AFM/SPMThe atomic force microscope (AFM) / scanning probe microscope (SPM) images and measures materials at the nanoscale.Due to funding some restrictions may apply to the use of this item. For further details please contact Mark Rushforth or Sara Baldock.

Contact Dr Sara Baldock s.baldock@lancaster.ac.uk

Issues with this record should be reported to cis.resources@lancaster.ac.uk