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Scanning electron microscope -JEOL FESEM6301F

Oxford ISIS X-ray analyser, Magnifications up to 500,000x, Cryogenic stage for studying hydrated specimens, Imaging at low accelerating voltages of 1-5KV, High sensitivity backscattered detector.
Part of Organization: Chemistry

Contact Ursula Potter +441225385651

Issues with this record should be reported to research-equipment-sharing@bath.ac.uk