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JEOL 4500XT UHV scanning tunneling microscope

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This UHV chamber has the following facilities: scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), reflection high-energy electron diffraction (RHEED), 2 K-cells, e-beam metal evaporator, H-cracker, radical gas source, Ar ion sputtering. Samples must be conducting or semi-conducting and be atomically flat and clean.

Contact Martin Castell martin.castell@materials.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk