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FEI Quanta 200 3D

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The FEI Quanta 200 3D DualBeam FIB/SEM provides site-specific preparation of samples for TEM analysis, combines traditional thermal emission SEM with FIB to provide integrated micro-sectioning capabilities, allowing 3D analysis of a sample within the FIB/SEM, or preparation of suitable site-specific samples for TEM analysis. Ion beams can also be used for highly localised ion-beam induced metal deposition of suitable metals (e.g. Tungsten), allowing for the formation of electrical contacts to materials. The FIB/SEM is equipped with a Quoruom Technologies PP2000T Cryo transfer system to enable a wide range of biological materials to be processed.

Model: Quanta 200 3D

Manufacturer: FEI

Contact pczka@exmail.nottingham.ac.uk

Contact pazcdjp@exmail.nottingham.ac.uk

Issues with this record should be reported to kitcatalogue@nottingham.ac.uk