The FEI Quanta 200 3D DualBeam FIB/SEM provides site-specific preparation of samples for TEM analysis, combines traditional thermal emission SEM with FIB to provide integrated micro-sectioning capabilities, allowing 3D analysis of a sample within the FIB/SEM, or preparation of suitable site-specific samples for TEM analysis. Ion beams can also be used for highly localised ion-beam induced metal deposition of suitable metals (e.g. Tungsten), allowing for the formation of electrical contacts to materials. The FIB/SEM is equipped with a Quoruom Technologies PP2000T Cryo transfer system to enable a wide range of biological materials to be processed.
Model: Quanta 200 3D