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JEOL JEM-3000F FEGTEM

More information.

Field emission gun (FEG) TEM with a point resolution of 0.16 nm. Equipped with an Oxford Instruments energy dispersive X-ray spectrometer (EDS) with a super atmospheric thin window (SATW) detector.

Contact Neil Young neil.young@materials.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk