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Transmission Electron Micorscope JOEL 1200EX

TEM operating at 100kV ; STEM condenser system for STEM imaging, convergent beam diffraction at 100kV; Secondary Electron detector for sample surface imaging

Contact a.j.bushby@qmul.ac.uk +442078825276

Issues with this record should be reported to equpiment-data@qmul.ac.uk