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Field Emission-Scanning Electron Microscope

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The ??IGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column with its in-lens secondary electron detection, the ??IGMA series brings you unparalleled resolution, contrast and brightness for imaging highly topographical samples. Featuring high vacuum and variable pressure modes of operation you profit from high definition imaging of conducting and non-conducting samples.

Model: SIGMA VP

Manufacturer: Carl Zeiss Ltd

Contact tao.wu@nottingham.edu.cn

Contact kaiqi.shi@nottingham.edu.cn

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