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Scanning Electron Microscope FEI Quanta 3D Environmental SEM

FEG Environmental scanning electron microscope (ESEM); Scanning Transmission Electron Microscopy (STEM) in high-vacuum and wet conditions with sub-nanometre resolution; Integrated Gatan cryogenic preparation cold stage; In situ atomic force microscope within ESEM chamber; Focused ion beam for 5-7nm patterning and platinum deposition; Energy dispersive x-ray analysis (EDS)

Contact a.j.bushby@qmul.ac.uk +442078825276

Issues with this record should be reported to equpiment-data@qmul.ac.uk