The JSM-6060LV is a high-performance, compact, scanning electron microscope with excellent SE and BSE resolution. The intuitive PC interface allows the instrument to be easily operated. The specimen chamber can accommodate a specimen of up to 32mm in diameter or Philips 12mm sample stubs. Standard automated features include auto focus, auto gun (Bias), auto stig, auto saturation, and automatic contrast and brightness. The fully automatic Low Vacuum mode (on the JSM-6060LV model), allows for observation of specimens that cannot be viewed at high vacuum because of a non-conductive surface. There is also attached a cryo facility for imaging wet samples at ultra low temperatures with a cold knife for freeze fracturing.