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Atomic force microscope

More information.

Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.

http://www.birmingham.ac.uk/facilities/advanced-materials-characterisation-2/facilities/index.aspx

Contact James Bowen (AWM Facilities Manager) j.bowen.1@bham.ac.uk

Contact Michael Adams (Lead PI) m.j.adams@bham.ac.uk

Issues with this record should be reported to a.c.jones@bham.ac.uk