Get in touch
Transmission electron microscope (TEM) CM20 Scanning TEM Philips
Can be used to obtain information on atomic number contrast, elemental analysis and diffraction up to temperatures of 1300°C. Philips CM20 Scanning TEM.
Part of Organization: Cranfield Uni
Issues with this record should be reported to
If your search on our database results in an equipment or facilities collaboration we'd like to hear about it, all feedback on both successes and challenges will help us in enabling more partnerships. Click on the feedback tab.