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Agilent SuperNova X-Ray Diffractometer

Ultra high resolution single crystal X-Ray diffractometer, with Cu and Mo dual source, for full structural analysis, determination of absolute structure and investigation of phase transitions of chemical compounds, including very small crystals.
Part of Organization: Chemistry

Contact Gabriele Kociok-Kohn +441225386520

Issues with this record should be reported to research-equipment-sharing@bath.ac.uk