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Digital Instruments MultiMode SPM Nanoscope

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Surface Metrology of samples. Allows AFM, STM and magnetic images to be taken. Typically, lateral resolution > 1 nm, height resolution >1 A. Samples must be less than 5 mm thick and 10 mm in diameter.

Contact Robert Jacobs robert.jacobs@chem.ox.ac.uk

Issues with this record should be reported to research.facilities@admin.ox.ac.uk