JSM-7100F Field Emission Scanning Electron Microscope
The FE-SEM consists of a high resolution field emission electron column. This allows for high magnification and resolution imaging using electrons.
Different Capabilities
- Low Vacuum Mode
- Large Depth Field
- UED
- LED
- USD
Model: JSM - 7100F
Manufacturer: JEOL
Contact 
k.yendall@lboro.ac.uk
Contact s.s.doak@lboro.ac.uk
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