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JSM-7100F Field Emission Scanning Electron Microscope

More information.

The FE-SEM consists of a high resolution field emission electron column. This allows for high magnification and resolution imaging using electrons.

Different Capabilities

  • Low Vacuum Mode
  • Large Depth Field
  • UED
  • LED
  • USD

Model: JSM - 7100F

Manufacturer: JEOL

Contact k.yendall@lboro.ac.uk

Contact s.s.doak@lboro.ac.uk

Issues with this record should be reported to kit-catalogue@lboro.ac.uk