JEOL 4500s UHV scanning tunneling microscope / scanning electron microscope
This UHV chamber has the following facilities: scanning tunneling microscopy (STM), scanning electron microscopy (SEM), low-energy electron diffraction (LEED), 3 K-cells, Ar ion sputtering, X-ray photoelectron spectroscopy (XPS), Auger spectroscopy. Samples must be conducting or semi-conducting and be atomically flat and clean.
Contact Martin Castell 
martin.castell@materials.ox.ac.uk
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