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Scanning Electron Microscope FEI Inspect-F - primary analytical electron microscope for chemical composition work

High vacuum FEG source scanning electron microscope (SEM); EDS high speed elemental analysis and mapping; WDS high spectral resolution elemental analysis (10eV); EBSD crystallographic texture analysis, grain orientation and mapping; Scanning Transmission Electron Microscopy (STEM) in high-vacuum with sub-nanometre resolution

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